NI Multisim NI Multisim (formerly MultiSIM ) is an electronic schematic capture and simulation program which is part of a suite of circuit design programs, along with NI Ultiboard. Multisim is one of the few circuit design programs to employ the original Berkeley SPICE based software simulation. Multisim was originally created by a company named Electronics Workbench, which is now a division of National Instruments. Multisim includes microcontroller simulation (formerly known as MultiMCU), as well as integrated import and export features to the Printed Circuit Board layout software in the suite, NI Ultiboard. Multisim is widely used in academia and industry for circuits education, electronic schematic design and SPICE simulation. History Multisim was originally called Electronics Workbench and created by a company called Interactive Image Technologies. At the time it was mainl...
Accurately Evaluate Circuits with New Probes in Multisim
Introduction
The probe functionality has been redesigned in Multisim to allow additional measurement functionalities in Multisim. Whether you’re learning for the first time about an inverting amplifier circuit or designing a sophisticated switching power supply, the new probes will help you gain knowledge of your circuit performance quickly and easily.
The new Voltage, Current, Power, and Digital probes provide:
- A clear and convenient way of acquiring common measurements, such as voltages, branch current, and power.
- Automation of the output variable selection process in analyses (such as Transient and AC Sweep); after an analysis is run, variables from probes are automatically plotted in the Grapher.
- Differential voltage
- Open the 3-phase inverter sample circuit in Multisim available under File>Open Samples under Power Conversion>DC-AC
- Place 6 Digital probes on the PWM signals S1 to S6 as shown below
- Open the Transient Simulation settings by clicking on the wrench icon in the toolbar and notice the placement of the analog and digital probes in the Output tab
- Moreover, when the analysis is run, variables from probes are automatically plotted in the Grapher and saved to a raw file . Variables from voltage, current, and power probes are plotted on the analog graph, while variables from digital probes are plotted on the digital graph.
New Probes in Multisim
The new probes could be found by default in a new toolbar in Multisim
The available probes are:
These probes can measure voltage, current or both. You can use the probe’s properties dialog to change the measurement as needed and the symbol updates to reflect the selection.
Measures the power dissipated or generated by a component.
This probe is for interactive simulation only. During simulation, the symbol updates dynamically with 1, 0, x. High and low digital thresholds for analog nets can be set in the Digital Probe Properties dialog box.
Click once to place a voltage probe and again to place a reference probe. The voltage measured between these two points is the differential voltage
Provides a reference net to a voltage probe. Without a reference probe, a voltage probe will reference net 0. Use for differential voltage measurements. This an alternative to placing a pair of Differential voltage probes. Use if you have placed a number of voltage probes that you want to reference to a given point.
Probes stay with wires and components when the wires are moved. They are not deleted when their nets, net segments, or components are deleted.
Probes in Interactive Simulation
Probes display measurements based on the settings in Interactive Simulation (Simulate»Analyses and simulation).
The displayed parameters can be configured locally on each probe or globally using the Probe Settings dialog box (Simulate»Probe settings).
The Digital Probe is special in that it displays the instantaneous value of the digital signal directly inside of the probe symbol. It does not have a Parameters tab in its properties dialog.
The instantaneous parameters are useful for all signal types. Periodic parameters are best suited to periodic signals. They may provide misleading results for transient events. It is recommended that you use Transient analysis and the Grapher's post processing functions to perform calculations on signals that are not periodic.
Probes in Advanced Analyses
To enable users to quickly get to simulation results and perform faster measurements on their circuit, when a new probe is placed, it automatically appears in the Selected variables for analysis list in the Analyses and Simulation dialog box for several of the analyses available in Multisim.
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